Valtr, Miroslav: search on Z-Library

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1

Graphics cards based topography artefacts simulations in Scanning Thermal Microscopy

Klapetek, Petr, Martinek, Jan, Grolich, Petr, Valtr, Miroslav, Kaur, Nupinder Jeet

Journal:

International Journal of Heat and Mass Transfer

Year:

2017

Language:

english

File:

PDF, 1.81 MB

english, 2017

2

Voice coil-based scanning probe microscopy

Petr Klapetek, Miroslav Valtr, Václav Duchoň, Jaroslav Sobota

Journal:

Nanoscale Research Letters

Year:

2012

Language:

english

File:

PDF, 869 KB

english, 2012

3

How levelling and scan line corrections ruin roughness measurement and how to prevent it

NeÄas, David, Valtr, Miroslav, Klapetek, Petr

Journal:

Scientific Reports

Year:

2020

File:

PDF, 7.32 MB

2020

4

SThM-based local thermomechanical analysis: Measurement intercomparison and uncertainty analysis

Guen, Eloise, Klapetek, Petr, Puttock, Robert, Hay, Bruno, Allard, Alexandre, Maxwell, Tony, Chapuis, Pierre-Olivier, Renahy, David, Davee, Guillaume, Valtr, Miroslav, Martinek, Jan, Kazakova, Olga, G

Journal:

International Journal of Thermal Sciences

Year:

2020

File:

PDF, 1.27 MB

2020

5

Optical characterization of ultrananocrystalline diamond films

Franta, Daniel, Zajíčková, Lenka, Karásková, Monika, Jašek, Ondřej, Nečas, David, Klapetek, Petr, Valtr, Miroslav

Journal:

Diamond and Related Materials

Year:

2008

Language:

english

File:

PDF, 354 KB

english, 2008

6

Estimation of roughness measurement bias originating from background subtraction

NeÄas, David, Klapetek, Petr, Valtr, Miroslav

Journal:

Measurement Science and Technology

Year:

2020

File:

PDF, 10.50 MB

2020

7

Short-Range Six-Axis Interferometer Controlled Positioning for Scanning Probe Microscopy

Lazar, Josef, Klapetek, Petr, Valtr, Miroslav, Hrabina, Jan, Buchta, Zdenek, Cip, Onrej, Cizek, Martin, Oulehla, Jindrich, Sery, Mojmir

Journal:

Year:

2014

Language:

english

File:

PDF, 383 KB

english, 2014

8

Multiple fibre interferometry setup for probe sample interaction measurements in atomic force microscopy

Klapetek, Petr, Yacoot, Andrew, HortvÃk, VÃ¡clav, DuchoÅ, VÃ¡clav, Dongmo, Herve, Rerucha, Simon, Valtr, Miroslav, NeÄas, David

Journal:

Measurement Science and Technology

Year:

2020

File:

PDF, 1.33 MB

2020

9

Scanning probe microscopy analysis of delaminated thin films

Klapetek, Petr, Buršíková, Vilma, Valtr, Miroslav

Journal:

Journal of Physics Conference Series

Year:

2007

Language:

english

File:

PDF, 220 KB

english, 2007

10

Near-field scanning optical microscope probe analysis

Petr Klapetek, Jiří Buršík, Miroslav Valtr, Jan Martinek

Journal:

Ultramicroscopy

Year:

2008

Language:

english

File:

PDF, 640 KB

english, 2008

11

Uncertainty modeling in nanoscale scanning probe microscopy measurements of fullerene C 60

Campbellová, Anna, Klapetek, Petr, Valtr, Miroslav

Journal:

Measurement Science and Technology

Year:

2011

Language:

english

File:

PDF, 398 KB

english, 2011

12

Large area Scanning Thermal Microscopy and infrared imaging system

Martinek, Jan, Valtr, Miroslav, Hortvík, Václav, Grolich, Petr, Briand, Danick, Shaker, Marjan, Klapetek, Petr

Journal:

Measurement Science and Technology

Year:

2018

Language:

english

File:

PDF, 1.92 MB

english, 2018

13

Characterization of near-field optical microscope probes

Petr Klapetek, Miroslav Valtr, Petr Klenovský, Jiří Buršík

Journal:

Surface and Interface Analysis

Year:

2008

Language:

english

File:

PDF, 770 KB

english, 2008

14

Protective double-layer coatings prepared by plasma enhanced chemical vapor deposition on tool steel

Mureşan, Mihai-George, Campbell, Anna Charvátová, Ondračka, Pavel, Buršíková, Vilma, Peřina, Vratislav, Polcar, Tomáš, Reuter, Stephan, Hammer, Malte U., Valtr, Miroslav, Zajíčková, Lenka

Journal:

Surface and Coatings Technology

Year:

2015

Language:

english

File:

PDF, 1.74 MB

english, 2015

15

Rough surface scattering simulations using graphics cards

Petr Klapetek, Miroslav Valtr, Aleš Poruba, David Nečas, Miloslav Ohlídal

Journal:

Applied Surface Science

Year:

2010

Language:

english

File:

PDF, 370 KB

english, 2010

16

Near-field optical microscopy simulations using graphics processing units

Petr Klapetek, Miroslav Valtr

Journal:

Surface and Interface Analysis

Year:

2010

Language:

english

File:

PDF, 462 KB

english, 2010

17

Small-load nanoindentation experiments on metals

Anna Campbellová, Petr Klapetek, Vilma Buršíková, Miroslav Valtr, Jiří Buršík

Journal:

Surface and Interface Analysis

Year:

2010

Language:

english

File:

PDF, 271 KB

english, 2010

18

Gwyscan: a library to support non-equidistant scanning probe microscope measurements

Klapetek, Petr, Yacoot, Andrew, Grolich, Petr, Valtr, Miroslav, Nečas, David

Journal:

Measurement Science and Technology

Year:

2017

Language:

english

File:

PDF, 4.54 MB

english, 2017

19

Influence of Silicon, Oxygen and Nitrogen Admixtures Upon the Properties of Plasma Deposited Amorphous Diamond-Like Carbon Coatings

Buršíková, Vilma, Zajíčková, Lenka, Dvořák, Pavel, Valtr, Miroslav, Buršík, Jiří, Bláhová, Olga, Peřina, Vratislav, Janča, Jan

Journal:

Journal of Advanced Oxidation Technologies

Year:

2006

Language:

english

File:

PDF, 222 KB

english, 2006

20

Traceable measurements of small forces and local mechanical properties

Campbellová, Anna, Valtr, Miroslav, Zůda, Jaroslav, Klapetek, Petr

Journal:

Measurement Science and Technology

Year:

2011

Language:

english

File:

PDF, 467 KB

english, 2011

21

Tip–sample relaxation as a source of uncertainty in nanoscale scanning probe microscopy measurements

Campbellová, Anna, Klapetek, Petr, Valtr, Miroslav

Journal:

Measurement Science and Technology

Year:

2009

Language:

english

File:

PDF, 418 KB

english, 2009

22

Non-equidistant scanning approach for millimetre-sized SPM measurements

Petr Klapetek, Miroslav Valtr, Petr Buršík

Journal:

Nanoscale Research Letters

Year:

2012

Language:

english

File:

PDF, 1.44 MB

english, 2012

23

Development of reference materials for the investigation of local mechanical properties at the nanoscale

Anna Charvátová Campbell, Petr Klapetek, Miroslav Valtr, Vilma Buršíková

Journal:

Surface and Interface Analysis

Year:

2012

Language:

english

File:

PDF, 162 KB

english, 2012

24

[IEEE 2018 24rd International Workshop on Thermal Investigations of ICs and Systems (THERMINIC) - Stockholm (2018.9.26-2018.9.28)] 2018 24rd International Workshop on Thermal Investigations of ICs and Systems (THERMINIC) - Local Thermophysical Properties Measurements on Polymers using Doped Silicon SThM Probe: Uncertainty Analysis and Interlaboratory Comparison

Guen, Eloise, Chapuis, Pierre-Olivier, Klapetek, Petr, Puttock, Robb, Hay, Bruno, Allard, Alexandre, Maxwell, Tony, Renahy, David, Valtr, Miroslav, Martinek, Jan, Gomes, Severine

Year:

2018

File:

PDF, 473 KB

2018

25

Atomic force microscopy analysis of nanoparticles in non-ideal conditions

Petr Klapetek, Miroslav Valtr, David Nečas, Ota Salyk, Petr Dzik

Journal:

Nanoscale Research Letters

Year:

2011

Language:

english

File:

PDF, 938 KB

english, 2011

26

SPIE Proceedings [SPIE SPIE OPTO - San Francisco, California, United States (Saturday 1 February 2014)] Photonic Instrumentation Engineering - Six-axis interferometric coordinates measurement system for nanometrology

Soskind, Yakov G., Olson, Craig, Hrabina, Jan, Lazar, Josef, Klapetek, Petr, Valtr, Miroslav, Cip, Ondrej, Oulehla, Jindrich, Cizek, Martin, Hola, Miroslava, Sery, Mojmir

Year:

2014

Language:

english

File:

PDF, 1.59 MB

english, 2014

27

AFM and FIB Study of Cyclic Strain Localization and Surface Relief Evolution in Fatigued f.c.c. Polycrystals

Man, Jiří, Valtr, Miroslav, Kuběna, Ivo, Petrenec, Martin, Obrtlík, Karel, Polák, Jaroslav

Journal:

Advanced Materials Research

Year:

2014

Language:

english

File:

PDF, 3.04 MB

english, 2014

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